Solid Phase Characterization Laboratory (139)

This multi-user facility allows for full characterization of soil, sediment, and rock samples to determine bulk mineralogical and elemental composition, and grain and sub-grain-scale texture and morphology. The instrumentation includes: a Hitachi TM3030 Tabletop Scanning Electron Microscope (SEM) with Bruker Quantax 70 Plus Energy Dispersive Spectrometer; Panalytical Epsilon 3XLE benchtop energy dispersive X-ray fluorescence (EDXRF) spectrometer; and a Rigaku MiniFlex X-ray diffractometer (XRD) with PDXL software including the Whole Pattern Powder Fitting (WPPF) method, connected to the ICDD PDF-2 database. The XRD was purchased through NSF-EAR-IF grant #1658681.